Crack Measuring Device
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Electronic Crack Measuring Device RCD-WD Applications : Crack Intergrated detector is mainly used for crack width and crack depth measurement of bridges, tunnels, buildings, roads and so on. Main Features: Professional Design Standard probe and high grade probe. Two detection methods : standards and simple depth measurement. Standard ultrasonic transducer bracket, precise and adjustable; free from scene marking-out, which can greatly improve the detection efficiency. Image automatic recognition and width intelligent computing technology; crack position without adjustment. Crack automatic identification and calculation; real-time display; Human-computer interaction. Friendly human-computer interactive interface Various built-in various helpful files and demo video facilitate the users to conduct skilled instrument operation. Mass Storage 4GB Large-capacity SD card can store more than 100,000 data.
Semiconductor Diode Characteristics
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Code: EEN0012 Semiconductor Diode Characteristics. Semiconductor Diode Characteristics Experimental training board has been designed specifically for plotting Characteristics of Ge & Si Semiconductor Diodes. The board is absolutely self contained and requires no other apparatus. Practical experience on this board carries great educative value for Science and Engineering Students. Object: To Study and Plot the Forward and Reverse Bias characteristics of (Ge & Si) Semiconductor Diodes. To Determine the Static and Dynamic resistances of Forward Biased p-n junction of the given Diodes. Features:The board consists of following built-in parts: 0-10V D.C. at 50mA, continuously variable with Coarse & Fine Pots, regulated Power Supply. D.C. Voltmeter, 65mm rectangular dial, with switch selectable ranges of 1V and 10V. D.C. Microammeter, 65mm rectangular dial, with switch selectable ranges of 50 mA and 10mA. Ge and Si Semiconductor Diodes. Adequate no. Of other electronic components. Mains ON/OFF switch and Fuse
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