Sipcon Instrument Industries HSIDC Industrial Estate, Ambala, Haryana

perfect solution for visual inspection for both industrial and biomedical applications. applications ♦ semiconductor ♦ electronics ♦ biomedical ♦ automotive ♦ testing & identification ♦ food and beverage ♦ fibre optic component ♦ telecommunications ♦ pharmaceutical ♦ medical device ♦ nanotechnology ♦ photonics and biophotonics   .

Highly precise metal base and column Superior measurement accuracy and repeatability for tight tolerance application Automatic video edge detection High resolution parafocal zoom lens. Flat Field high resolution optics for sharp uniform images Unmatched illumination flexibility for difficult measurements Powerful, flexible software for programmability Advanced mechanical design resulting in high speed & accuracy Manual operation with quick-moving stage  

Magnification Range : 40X-1500X

Magnification Range : 30X-150X

We are offering Tool Inspectors

Country of Origin : Made in India

Features : No operator dependence, Zero maintenance, No moving part

Features : better accuracy and repeatability,

Granite table confirming to DIN 876 standarda ensure perfect flatness of the table. Powerful, flexible software for programmability and flexibility. Automatic Video Edge Detection. High Resolution Parafocal zoom lenses. Hollow Z-axis structure reduces distortion of its own. Advanced mechanical design resulting high speed & accuracy. Drive systems provide faster and better motion capability. Highly suitable for large size PCB inspection or sheet metal components. Flat field High Resolution Optics for sharp uniform images. Unmatched illumination flexibility for difficult measurements. Options of Touch probe and Laser probe improves the 3d measuring capabilities of the machine.  

Model Number : SPN-300

Country of Origin : Made in India

Brand Name : Sipcon

Magnification Range : 4X-132X

Fully VERSATILE High Precision MEASURING Microscope "SIPCON" Allows Non-contact, High Precision depth(step) Measurements Through simple operation while observing The surface of a point of measurement