Microscope Dealers in Hsr Layout, Bangalore

Atomic Force Microscope measures the roughness of a sample surface at a high resolution, and performs microfabrication of a sample. Also provides 3D information from simultaneous Scanning Electron Microscopy and AFM pictures.   The SuperFlat AFM combines the power of SEM and AFM. Information on lateral dimensions and material from in-situ inspection can be complemented by precise AFM topographical and frictional information. The tool is flat and compact enough to fit through the majority of SEM load-locks, allowing ease of use and increasing throughput. In addition, its size offers enormous stability and vibration dampening advantages, which are particularly attractive when using the tool ex-situ. Compatible with most of the Scanning Electron Microscopes and FIBs available in the market such as, Carl Zeiss, FEI, Tescan, Jeol, Hitachi, Olympus, etc.

• Weight: 7 kg
• Glass filter: blue, yellow,green.
• 0-fold planocular lenses: 4 x /NA 0.10; 10 x/NA 0.25; 40 x 0.65, 100 x NA 1.25 oil
• Phase contrast device: for microscope MBL2000, 40x, NA 0,65
• Microscope slides: semi-frosted, cut, 50 pieces, Dimensions: (76 x 26 x 1)mm (B x D x H)
• Cover glass for micro scope: 100 pieces, Dimensions: (18 x 18 x 0,15)mm (Bx D x H)
• 10 pieces, Dimensions: (26 x 20 x 0,4) mm (B x D x H)
• Dimensions: (76 x26x1,32)mm (BxD xH) with depression

Magnification: 50-80x Focusing wheel Adjustable bulb (2.2 v) Adjustable zoom Material: plastic Dimensions (approx): 15 x 4 x 2 cm Weight (approx): 65 g (without case and batteries)

Microscope, Beakers, lab instruments, Vessels

Microscope, Centrifuge

Dental Operating Surgical Microscope