Binocular Microscope
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Pocket Microscope
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Magnification: 50-80x Focusing wheel Adjustable bulb (2.2 v) Adjustable zoom Material: plastic Dimensions (approx): 15 x 4 x 2 cm Weight (approx): 65 g (without case and batteries)
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Dental Operating Surgical Microscope
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atomic force microscope
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Atomic Force Microscope measures the roughness of a sample surface at a high resolution, and performs microfabrication of a sample. Also provides 3D information from simultaneous Scanning Electron Microscopy and AFM pictures. The SuperFlat AFM combines the power of SEM and AFM. Information on lateral dimensions and material from in-situ inspection can be complemented by precise AFM topographical and frictional information. The tool is flat and compact enough to fit through the majority of SEM load-locks, allowing ease of use and increasing throughput. In addition, its size offers enormous stability and vibration dampening advantages, which are particularly attractive when using the tool ex-situ. Compatible with most of the Scanning Electron Microscopes and FIBs available in the market such as, Carl Zeiss, FEI, Tescan, Jeol, Hitachi, Olympus, etc.
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Telescope, Vessels, microarray data analysis software service
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Centrifuge