Profilometer Dealers in Bangalore

Profilometers

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Nanovea 3D Non-Contact Profilometers are designed with leading edge optical pens using superior white light axial chromatism. Nano through macro range is obtained during measurement (profile, dimension, roughness, finish, texture, shape, form, topography, flatness, warpage, volume, area, step-height, depth, thickness & others) on a wider range of geometries and materials than any other Profilometer. With the selection of a large range of optical pens users can precisely measure an endless range of applications. Nanovea optical pens have zero influence from sample reflectivity, have advanced ability to measure high surface angles and no sample no preparation is required. Easily measure any material whether transparent, opaque, specular, diffusive, polished, rough etc. Unlike other optical measurement techniques, large surface areas can be precisely measured without any imaging stitching.

Profilometer

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The Jr25 is the first truly portable high performance Profilometer of its kind. With an optional battery pack and carrying case, the Jr25 provides measurement capability during field studies. The Jr25 is designed to utilize the superior Chromatic Confocal technique with complete portability. With a total weight less than 5.5 Kg, the operator can safely place the Jr25 onto the surface under inspection. The Jr25 has the ability to measure an area up to 25mm x 25mm and focusing on the surface is easy with an adjustment range of 30mm. With a fully rotational scanning head, the Jr25 has the ability to measure surfaces at difficult angles. Along with quick and ease of use, the Jr25 has been designed specifically for production environments where samples cannot be moved or in open field studies. The scanning head of the Jr25 can also be integrated onto automated robotic arms and other equipments.   he Chromatic Confocal technique uses a white light source (LED) that passes through a series of lenses, called an optical pen, which has a high degree of chromatic aberration. The refractive index of the lenses will vary the focal distance of each wavelength of the white light. In effect, each separate wavelength of the white light will focus at a different distance from the optical pen, creating the measurement range. When a surface of interest is within the measurement range a single wavelength of the white light will be in focus while all others will be out of focus. The white light is then reflected back through the optical pen, then through a pin hole filter that allows only the focused wavelength to pass through to a CCD spectrometer. The CCD will indicate the wavelength in focus, which corresponds to a specific distance for a single point. The physical wavelength measured uses no algorithms providing the highest accuracy independent of form, roughness level, illumination and measurement speed. There is no special levelling procedure required. And while others make claims of resolutions Nanovea provides high accuracy.• Physical Wavelength Measured + No Algorithms Needed for Results = Higher Accuracy• Level of accuracy independent of form, roughness level, illumination and measurement speed• No special levelling procedure required• Most claim very high resolutions. Nanovea provides high accuracy. CHROMATIC CONFOCAL MEASUREMENT Chromatic Confocal by design ensures the highest accuracy of all optical techniques. Specifically when measuring surfaces that are geometrically complex (randomly rough surfaces). Other techniques are subject to many error sources that are simultaneously present and it is not possible to remove or compensate for them or even to estimate their combined influences. The Profilometer offer high accuracy across the widest range of materials and surfaces conditions including tissues, biomaterials, polymers, plastics, metals, composites and ceramics. As an additional measurement signal to the height data, the technique also provides reflection intensity which can be used for highlighting features not seen by height variations.  It can also be used to quantitatively measure variation of surface reflectivity.

Stylus Profilometer

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Stylus Profilometer, silicon wafer, spin coater

Profilometer

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Profilometer, Spectroscopy