Estec Systems & Solutions Pvt. Ltd. Velachery, Chennai, Tamil Nadu

dats 5000 fault analyzer dats 5000 test system employs the powerful in-circuit test method to test all active components on a printed circuit board (pcb). in dats 5000 the input test patterns are driven by the tester through test clips and the resultant output is read back. the output is then compared by software with expected pattern to declare a device good. dats 5000 test system is designed to test devices that operate at any voltage level between +/-12v both in in-circuit and out circuit modes. it has a device library that would cover most standard devices. dats 5000 also employs vi trace facility for checking passive components. the visa trace is successfully employed to test passive and active components like resistors, capacitors, diodes, transistors, hybrids and custom devices as well as those devices for which no data is available to carry out functional test.   features capable of in-circuit testing of pcb s with digital, analog, mixed signal and mixed logic devices board learn & test options available for functional & vi trace tests 48 digital channels expandable to user requirement in steps of 2 32k ram behind pin clock speed available from 500khz [dats5000a] to 10mhz [dats5000b] drive and sense voltages programmable from -10v to +10v features include loop test, identify option, voltage and contact test

Color : white

Application : electronic lab

DATS5000 Test System employs the powerful in-circuit test method to test all active components on a Printed Circuit Board (PCB). In DATS5000 the input test patterns are driven by the tester through test clips and the resultant output is read back. The output is then compared by software with expected pattern to declare a device good. DATS5000 test system is designed to test devices that operate at any voltage level between +/-12V both in in-circuit and out circuit modes. It has a device library that would cover most standard devices. DATS5000 also employs VI trace facility for checking passive components. The VISA trace is successfully employed to test passive and active components like resistors, capacitors, diodes, transistors, Hybrids and custom devices as well as those devices for which no data is available to carry out functional test. Features Capable of in-circuit testing of PCB s with digital, analog, mixed signal and mixed logic devices Board learn & test options available for functional & vi trace tests 48 digital channels expandable to user requirement in steps of 2 32k RAM behind pin Drive and Sense voltages programmable from -10V to +10V Features include loop test, identify option, voltage and contact test