Qmax Test Equipments Private Limited Sholinganallur, Chennai, Tamil Nadu

Special Clips for Special type of devices. Properly identified IC Pins for easy and faster testing. Easy to Handle design for continuous operation. Suitable mainly for Rugged application with Gold plated and spring loaded pins. Pins are evenly spaced to match the component package suitably without any Misallignment for proper contact.

Test Clips to test ICs of SOIC Packages in the In-Circuit conditions are available readily with Qmax for various pin configurations like 8, 14, 16, 20, 24 & 28. These test clips are also gold plated and designed for proper contact and for repeated usage. Test clips are interfaced to the Qmax tester using FRC cable and EuroFRC connectors.

Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input Output Propagation delay Rise time Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.

Feature : Device Model Development for Integrated Chips and components. , In circuit /Card Edge Functional Testing of PCBA’s

Test Clips to test ICs of PLCC Packages in the In-Circuit conditions are available readily with Qmax for various pin configurations like 20, 28, 32, 44, 52, 68 & 84. These test clips are also gold plated and designed for proper contact and for repeated usage. Test clips are interfaced to the Qmax tester using FRC cable and Euro connectors. The test clips have a unique locking mechanism to hold the Device Under Test (DUT) properly.

The Master- Slave DSU based Panther4HT Wire Harness tester is designed for testing and verifying electrical connections in a cable, harness, backplane or any other wired assembly. It offers unique Qmax MASTER - Slave concept and SATELLITE UNIT Options to avoid looping back of cable to the ATE. All Satellite Units communicates the measurements through LAN interface which is very useful for on-board applications in Aircrafts Ships and similar applications where large cable looms are used. This innovative concept will eliminate the long adapter cables and hence storing, maintaining and re work of these kind of cables are avoided. Furthermore single Master Controller Unit (MCU) is used to control not only all the satellite units , but also communicate with all satellite units through Ethernet Communication port. A single reference Cable is used to link the all the satellite units with the Master Controller in controlled loop manner is a value add to the product.

Feature : Expandable hardware channels per requirement, User friendly software suite, Learns from sample board

Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.

Qmax has developed various out board testers for DIP as well as several types of SMD packages including PQFP & PGA.Test adaptors are available for DIP, SOP, SSOP, SOJ, SOIC, PLCC, PQFP, PGA Packages. These can be easily interfaced with Qmax testers. All sockets are specially designed for proper holding of the Device Under Test (DUT) and for reliable performance. Exclusive universal type adaptors for testing the SOJ, SOIC and PLCC Packages with press type or Zero Insertion Force (ZIF) sockets are available to test wide variety of ICs using single adaptor meant for that type of package. TTL and CMOS loads are supplied with the test adaptors to check the IC under loaded conditions.

The RF Signal Generator, provided by us, has the sampling rate of 241MSa/s. Our signal generator has duty-cycle correction, amplitude modulation function and frequency sweep function, which makes our RF signal generator more efficient.