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spectroscopic ellipsometer

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Spectroscopic ellipsometer is widely used for thin film and measurements. It uses a high speed CCD array detection to collect the entire spectrum. It measures films from nanometer thickness up to tens of microns and the optical properties from transparent to absorbing materials. It accurately measures optical constants like refractive index, film thickness and extinction coefficient.

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Ellipsometers, Zeta Potential Analyzers, Hollow Cathode Lamps, Profilometers