Film Thickness Measurement System Dealers

• Usage/Application: Laboratory
• Brand Name: Semiconsoft
• Model Name/Number: MProbe UV

We developed, in cooperation with leading manufacturers, a wide range of optical thin-film metrology instruments from high-precision sophisticated ellipsometry and reflectometry systems (spectroscopic, fast single wavelength and Imaging) for research and production applications to low-budget reflectometers for variety of applications, Ellipsometry is a nondestructive and highly sensitive optical measurement technique used to analyze thin-layer stacks.

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• Application: Laboratory
• Measure up to: 5 layers film thickness
• Conductive oxide: Indium Tin Oxide Coatings
• Optical coatings: TiO2, SiO2, Ta2O5
• Item Code: Spektrospin
• Payment Terms: T/T (Bank Transfer)

• Features: Easy to operate with Window based software , Array based detector system to ensure fast measurement , Affordable, portable and small footprint table top design , 2D and 3D output graphics .

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