Film Thickness Measurement System Dealers

(8 products available)
  • Wafer Frame Coating Thickness Measurement System

    Wafer Frame Coating Thickness Measurement System

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    • Aperture: 4x Changeable
    • Brand Name: Fischer
    • Power Supply: AC 115 V or AC 230 V 50 / 60 HzAC 115 V or AC 230 V 50 / 60 Hz
    • Protection Class: IP40
    • Power Consumption: Max. 120 W
    • Dimension: 660 x 835 x 720 mm
    • Design: Bench-top Unit with Hood Opening

    Coating thickness gauge for electroplating and electroless coatings XDV-U or X-Ray Fluorescence Tester is available in various technical specifications. These are widely used for non-destructive analyses and measurements of coating thickness on very small components and structures, even with complex coating systems.Applications Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames Analysis of very thin coatings, e.g., gold/palladium coatings of 0.1 ¼m (0.004 mils) Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control

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  • Film Thickness Measurement System

    Film Thickness Measurement System

    700,000 Per Piece

    1 Piece (MOQ)

    • Usage/Application: Laboratory
    • Brand Name: Semiconsoft
    • Model Name/Number: MProbe UV
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  • Best Deals from Film Thickness Measurement System

  • Film Thickness Measurement System

    Film Thickness Measurement System

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    • Features: Easy to operate with Window based software , Array based detector system to ensure fast measurement , Affordable, portable and small footprint table top design , 2D and 3D output graphics .
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    Research India
    Bhopal
    0.0 View Profile
  • Film Thickness Measurement System

    Film Thickness Measurement System

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    We developed, in cooperation with leading manufacturers, a wide range of optical thin-film metrology instruments from high-precision sophisticated ellipsometry and reflectometry systems (spectroscopic, fast single wavelength and Imaging) for research and production applications to low-budget reflectometers for variety of applications, Ellipsometry is a nondestructive and highly sensitive optical measurement technique used to analyze thin-layer stacks.

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  • Film Coating Thickness Measuring System

    Film Coating Thickness Measuring System

    750,000 Per Piece

    1 Piece (MOQ)

    • Application: Laboratory
    • Measure up to: 5 layers film thickness
    • Conductive oxide: Indium Tin Oxide Coatings
    • Optical coatings: TiO2, SiO2, Ta2O5
    • Item Code: Spektrospin
    • Payment Terms: T/T (Bank Transfer)
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  • Film Thickness Measurement System

    Film Thickness Measurement System

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    Global Film Thickness Measuring System Market research report gives a systematic and competent approach to gather important statistics of Global Film Thickness Measuring System industry. In which includes industry chain structure, Film Thickness Measuring System market classification, dominant market players, product definition, and product scope. Global Film Thickness Measuring System Market research report also interprets different market scenarios along with future market trends. Global Film Thickness Measuring System research report performs SWOT analysis to gain better insights on Strengths, Opportunities, and Threats muddled in Film Thickness Measuring System industry. Film Thickness Measuring System Market dynamics, production capacity, consumer volume, supply to demand ratio, Film Thickness Measuring System market share and revenue is also deliberated in this research report.

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  • Film Thickness Measurement System

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    Film Thickness Measurement System, ZSS- Series Solar Simulator

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  • Film Thickness Measurement System

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    Film Thickness Measurement System, silicon wafer

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