Profilometer Dealers

Laser Surface Profilometer

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Serving the clientele with finest assortment of products, we are a high-flying organization operating from New Delhi(India). We are the most promising name when it comes to Laser Surface Profilometer.

Optical Profilometer

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• Features: Frequency range from Static to 25MHz Measure vertical velocities up to 10 m/s

The Holographic MEMS Analyzer measures 3D vibrations over the full field of view without XYZ scanning. Millions of data points are acquired simultaneously for measurement of 3D vibrations with similar resolution as a laser vibrometer.

Affordability Profilometer

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With a small footprint (30 x 25 x 27cm), the PS50 is the most advanced compact Profilometer available. The high-performance PS50, with 50mm X-Y stages, is the ideal choice for upgrade and replacing stylus and laser profilers. The PS50 has the option of running by laptop which makes for an easy moving and installation where space is critical. Comes standard with 150mm x 150mm sample stage area to accommodate multiple and or larger samples. Quality Control options with macros for automatic testing and analysis recipes.• Compact Benchtop • 50mm x 50mm XY • Ideal Upgrade From Stylus and Laser Technologies • Highly Competitive Price & Financing Option Now Available The Chromatic Confocal technique uses a white light source (LED) that passes through a series of lenses, called an optical pen, which has a high degree of chromatic aberration. The refractive index of the lenses will vary the focal distance of each wavelength of the white light. In effect, each separate wavelength of the white light will focus at a different distance from the optical pen, creating the measurement range. When a surface of interest is within the measurement range a single wavelength of the white light will be in focus while all others will be out of focus. The white light is then reflected back through the optical pen, then through a pin hole filter that allows only the focused wavelength to pass through to a CCD spectrometer. The CCD will indicate the wavelength in focus, which corresponds to a specific distance for a single point. The physical wavelength measured uses no algorithms providing the highest accuracy independent of form, roughness level, illumination and measurement speed. There is no special levelling procedure required. And while others make claims of resolutions Nanovea provides high accuracy.• Physical Wavelength Measured + No Algorithms Needed for Results = Higher Accuracy• Level of accuracy independent of form, roughness level, illumination and measurement speed• No special levelling procedure required• Most claim very high resolutions. Nanovea provides high accuracy. CHROMATIC CONFOCAL MEASUREMENT Chromatic Confocal by design ensures the highest accuracy of all optical techniques. Specifically when measuring surfaces that are geometrically complex (randomly rough surfaces). Other techniques are subject to many error sources that are simultaneously present and it is not possible to remove or compensate for them or even to estimate their combined influences. The Profilometer offer high accuracy across the widest range of materials and surfaces conditions including tissues, biomaterials, polymers, plastics, metals, composites and ceramics. As an additional measurement signal to the height data, the technique also provides reflection intensity which can be used for highlighting features not seen by height variations.  It can also be used to quantitatively measure variation of surface reflectivity.

Optical Profilometer

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• Features: Frequency range from Static to 25MHz,Measure vertical velocities up to 10 m/s
• 3D Vibration Analysis: Full field of view measurement without XYZ scanning,in-plane vibrations resolution : 1 nm,out-of-pl

The Holographic MEMS Analyzer measures 3D vibrations over the full field of view without XYZ scanning. Millions of data points are acquired simultaneously for measurement of 3D vibrations with similar resolution as a laser vibrometer. MEMS Analysis Tool Software It is a post processing software that provides a solution for performing detailed and precise analysis of the 3D dynamic response of MicroElectroMechanical Systems (MEMS). The data produced by Koala Acquisition & Analysis can be directly analyzed by this software to perform analysis of MEMS MEMS geometries and movements are often complex to analyze with the presence of holes, or multiple structures. Displacements can be very small laterally and vertically, or very large compared to the structure size.

Profilometers

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Nanovea 3D Non-Contact Profilometers are designed with leading edge optical pens using superior white light axial chromatism. Nano through macro range is obtained during measurement (profile, dimension, roughness, finish, texture, shape, form, topography, flatness, warpage, volume, area, step-height, depth, thickness & others) on a wider range of geometries and materials than any other Profilometer. With the selection of a large range of optical pens users can precisely measure an endless range of applications. Nanovea optical pens have zero influence from sample reflectivity, have advanced ability to measure high surface angles and no sample no preparation is required. Easily measure any material whether transparent, opaque, specular, diffusive, polished, rough etc. Unlike other optical measurement techniques, large surface areas can be precisely measured without any imaging stitching.

Optical Profilometer

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Optical Profilometer, Platinum Counter Electrode, Laser Raman Spectrometer

Profilometer

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Profilometer, Test and Measuring Instruments, Digital Multimeter

Profilometers

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Profilometers, Zeta Potential Analyzers, Hollow Cathode Lamps, Ellipsometers

Profilometer

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Profilometer, Micro System Analyzer, NIR Spectrometers

Surface Profilometer

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Surface Profilometer, Digital Spectrophotometer, Dome Ip Camera

Profilometer

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Profilometer, Spectroscopy

Laser Based Offline Profilometer For Tyre Tread Measurement

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Laser Based Offline Profilometer For Tyre Tread Measurement, Cnc Rotary Table

Stylus Profilometer

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Stylus Profilometer, silicon wafer, spin coater