X-ray Fluorescence Spectrometer Dealers

supports various applications in many fields??? electricalelectronic materials rohs and halogen screening thin-film analysis for semiconductors, discs, liquid crystals, and solar cells ??? automobiles and machinery elv hazardous element screening composition analysis, plating thickness measurement, and chemical conversion coating film weight measurement for machine parts ??? ferrousnon-ferrous metals main component analysis and impurity analysis of raw materials, alloys, solder, and precious metals composition analysis of slag ??? mining grade analysis for mineral processing ??? ceramics analysis of ceramics, cement, glass, bricks, and clay ??? oil and petrochemicals analysis of sulfur in oil analysis of additive elements and mixed elements in lubricating oil chemicals analysis of products and organicinorganic raw materials analysis of catalysts, pigments, paints, rubber, and plastics ??? environment analysis of soil, effluent, combustion ash, filters, and fine particulate matter ??? pharmaceuticals analysis of residual catalyst during synthesis analysis of impurities and foreign matter in active pharmaceutical ingredients ??? agriculture and foods analysis of soil, fertilizer, and plants analysis of raw ingredients, control of added elements, and analysis of foreign matter in foods ??? other composition analysis of archeological samples and precious stones, analysis of toxic heavy metals in toys and everyday goods

Energy Dispersive X-Ray Fluorescence Spectrometer Simultaneous measu rement of Carbon*-Uranium can be obtained at a touch of a button. (*EDX-800HS) • A large sample chamber with an automated opening and closing door system allows Liquid , • Solid, Powder, and even a 300mm. Wafer sample to be analyzed. • Powerful and flexible software based on Windows x p® • Detectable element range: EDX-720900HS Na-U EDX-800HS C-U • EDX-900HS : requires no liquid N2 • Sample size: 300mm dia x 150mm height (max.)

The radition provided by a source of X – ray is allowed to fall on the sample to analysed. The enargy of the radiation must be sufficient to displace elctrons in the K, L or M shells of the atoms present in the sample. When an electrons from the K – shell is displaced it leaves a vacancy which destabilises the enargy structures of the atom. An electron from a higher – enargy level will fall into vacancy . such an electron can be provided by the L – shell , the enargy associated with this transfer correspondins to that of the emission of a photon of Ka with energy equal to the difference in energy possessed by electrons of the K and L shells. Such a transfer results also in a vacancy being created in the L – orbital which in turn is filled by transfer of an electron from the M – orbital with emission of a photon L. This allows the atom to return to a more stable energy state. The Spectrum of wavelengths resulting from the energy – level – jumps of the electrons into the K – orbital is called th “ K– Series”. Those originating in the L and M– orbitals are similarly called “L and M Series.

The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.

• Power Source: Electric
• Application: Laboratory Use
• Voltage: 220V

X-Ray fluorescence (XRF) spectrometry is an elemental analysis technique with broad application in science and industry. XRF is based on the principle that individual atoms, when excited by an external energy source, emit X-Ray photons of a characteristic energy or wavelength. By counting the number of photons of each energy emitted from a sample, the elements present may be identified and quantities.

We Offer EDX Pocket3 handheld X-ray Fluorescence Spectrometer specially developed for on-site analysis.It is the smallest,rapidest,most advanced and accurate XRF Analyzers on the market.It can be used widely in fields such as alloy analysis,mineral analysis,geographic analysis,scrap metals recycling analysis,RoHS testing and soil analysis.Moreover,it can also be used to perform material identification(PMI)and verification.It is a low cost XRF analyzer. Specification Working Principle: XRF analysis exploiting X-ray Fluorescence Spectrometry. Measurable Elements: S-U Detector: Advanced thermo-electric cooling Si-PIN Semiconductor X-ray detector with high performance and high energy resolution. Excitation Source: mini 40KV50µ-A X-ray tube. AgW anode target. Data Display: High definition and high resolution PDA(Personal Digital Assistant)with GPS function, Windows CE Operating System,stable Bluetooth Communication, personal data handing and e-mail sending. Data Storage: Large capacity SD card and SD card reader enable the data to store on PC and print-out. Power supply: Operating time of two fully charged Lithium batteries is no less than 8 hours. Weight: 1.4 Kilo (Without battery) Overall size: 260*325*125 mm (L * H* W) Ambient Environment temperature: 20°C-50°C Safety Feature: Both PDA and software operations are protected by passwords. Unauthorized people are not allowed to operate.

The WDX-200 Multi-channel X-Ray Fluorescence Spectrometer features have 10 fixed channels, for analysing 10 elements simultaneously. Elements are arbitrary from Na to U as required by the users. WDX-200 is an ideal quality control choice for large and medium-sized enterprises, is widely used in cement, steel, powder metallurgy, coal, petroleum, caoline, corhart, environment protection industries. The WDX detector can analyze various elements at a single given time, and addition with the wavelength. It provides the abilities of testing of more elements. The testing performance and capacity are more than those of a high-powered scanning wavelength dispersive x-ray fluorescence spectrometer.

• * Measurement Results: Cu (Combined with Fe, Co, Ni, Zn)
• Ag (Combined with Ru, Rh, Pd, Cd, In, Sn):  
• Au (Combined with Os, Ir, Pt):  
• * Accuracy of measurement: ±0.3% (Molten Metal above 90% Au) ±0.5% (Molten Metal below 90% Au)
• * Sensor: Gas Proportional Counter
• * Cooling for Detector: Air
• * Detection Range: 1%-----99.99%
• * Testing Time: 30-----200 secs
• * Test Spot Area: 0.3mm
• * Power Supply: 200-240V AC, 50/60Hz
• * Power Rating: 130 Watt
• * Working Temperature: 15-25°C
• * Relative humidity:  
• * Operation atmosphere: Vibration free surface and air conditioned room
• * Interface for Computer: Inbuilt (External Monitor, Keyboard required)
• * Software for Operation: Menu Driven User Friendly Operating System
• * Dimensions of Instrument: Length , 450mm Width , 350mm Height , 345mm (with test compartment cover in , closed position) & 565mm (in open position)
• * Dimensions of Sample Chamber: Length , 450mm Width , 350mm Height , 345mm (with test compartment cover in , closed position) & 565mm (in open position), 300mm Width
• * Net Weight: 30kg

• Type: X-Ray Fluorescence Spectrometer
• Certification: CE Certified, ISO 9001:2008
• Application: Laboratory Use
• Voltage: 220V
• Condition: New
• Display Type: Digital
• Power: 1kw
• Power Source: Electric
• Automation Grade: Automatic

X-ray fluorescence (XRF) analysis is a non-destructive method that can test the secondary characteristic x-rays (x-ray fluorescence) generated by the sample when the primary x-ray exciting the sample. This method can realize the fast measurement of the solid and liquid samples. XRF6 EDXRF Spectrometer Reemaz’s new type of high-end analytical instrument. It combines Reemaz's years of experience elements testing with unique product configurations and fully functional software. Its ergonomically design and friendly software interfaces grant the users a simple measurement job. Key Features Detector: SDD (Silicon Drift Detector) detector; High-quality energy resolution. Digital multi-channel technology: XRF60 use the industry's most advanced technology -digital multi-channel technology which can provide higher detection limit and accuracy. X-ray tube and system design: high-power x-ray tube and well system design provide excellent precious metal excitation and work efficiency. Data processing systems: special design application software, user-friendly interface. Collimating optical system: automatic replacement collimated optical system can meet a variety of user requirements. Sample observation systems: CCD camera. Shutter system: Replace the sample without closing high pressure; improve test efficiency and accuracy; the interlock design can ensure the safety of operator.

We are Opffering X-ray Fluorescence Spectrometer. specially Designed for On Site & Outdoor X-ray Fluorescence Analysis. range of Measuring Elements :- K to U large Capacity Lithium Battery, Long Hours of Independent Work arbitrary Optional Analysis & Identification Models independent Matrix Effect Correction Models multi- Variable Non-liner Regression Procudure repeatability:-0.1%

energy dispersive x-ray fluorescence spectrometers, paper converting machinery

X-Ray Fluorescence Spectrometers, Analog LED Light Sources

M6 Jetstream X-Ray Fluorescence Spectrometer, M1 Mistral XRF Spectrometers

x-ray fluorescence, x ray diffraction services, xrf spectrometers

X Ray Fluorescence Energy Dispersive Spectrometer, Hydrogen Generators

x-ray fluorescence spectrometer, Dew Point Meter, Sulphur Analyzer

x-ray fluorescence, water testing lab, Intergranular Corrosion Testing

Energy Dispersive X-Ray Fluorescence Spectrometer