xrf spectrometers
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1 Piece(s) (MOQ)
X-ray fluorescence for coating thickness measurement and material analysis Whether for coating thickness measurement or material analysis, Fischer is your partner of choice for precise and absolutely reliable measurement technology. With our X-ray systems, we offer highly efficient solutions to make your work as easy as possible. XRF coating thickness measurement is used for measuring metallic coating and multilayer coating thickness measurement.
Coating Thickness Spectrometer
2,000,000 Per Piece
1 Unit (MOQ)
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XRF Machine
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Xrf Spectrometer
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gold ed xrf 3600 spectrometer
1,800,000 Per piece
1 1 (MOQ)
xrf spectrometers
100,000 - 1,500,000 Per Piece
xrf instrument
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TEXAS is an online X-ray fluorescence device for the elemental analysis of bulk materials without sampling. It can be mounted above main conveyor belts or at other feeding devices and analyzes continuously the elemental composition (Z>12) of the material.The device is used as a tool for process control. It offers immediate information (247) about the process without time consuming sampling and analysis in the laboratory. However, it does not replace the laboratory but serves as a process tool for feed forward or feed back control.
Xrf Spectrometer
900,000 Per Piece
Xrf Spectrometer
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1 Piece (MOQ)
Xrf Spectrometer
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X-ray fluorescence spectrometer used for a non-destructive measurement, extremely sensitive, ideal for fast analysis of small areas and the rapid mapping of large surfaces Technical features: • HT generator 50 Kv accelerating voltage, 30 watts of power • X-ray tube with Mo anode of air-cooled • collimator of X-rays from 0.5mm and 20mm working distance, specimen holder of a manual type • solid-state detector (SDD silicon drift detector) cooled with Peltier technology • Video camera for viewing the sample analysis position and photographic documentation • Basic software for the management of all the instrumental parameters and analysis • Software for 'semi-quantitative analysis using fundamental parameters (FP Alloy, FP Plus) for the elements between Ti and U • Personal computer complete with monitor last generation 19 "TFT and color deskjet printer
xrf instrument
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xrf instrument, Spectrometers
xrf spectrometers
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xrf spectrometers, x ray diffraction services, x-ray fluorescence
Xrf Spectrometer
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energy dispersive xrf spectrometers
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energy dispersive xrf spectrometers
xrf instrument
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Handhel Xrf Instrument
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We offer Handhel Xrf Instrument. ElvaX Prospector Handheld XRF Alloy Analyzer (PMI Instrument). We are having SEVICE CENTER IN CHENNAI ONLY. We are pleased to introduce ourselves on behalf of our principle company Ms Elvatech Limited, Ukraine for ElvaX Prospector - Hand-held XRF alloy analyzer (from LAB INDIA) with Si Pin diode detector including Includes 21 element as standard: Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, W, Ta, Re, Pb, Bi, Ag, In, Sn, & Sb. The purpose of developing handheld PMI instrument was to have quick on-site analysis, grade identification, alloy sorting and mix up control of any ferrous and nonferrous sample without much sample preparation besides you also don't get any burn spot on the sample. So this technique is completely Non Destructing Technique (NDT). Now day’s majority of valves manufacturers, piping industries, ferrous and non-ferrous foundries, etc. are opting for PMI instrument for being 100% quality assured of the product. Trust, the above information is of use to you. Kindly write to us for technical discussion or for live demonstration of ElvaX Prospector Handheld XRF analyzer (PMI instrument) at your site. Please feel free to contact us should you require any further assistance
ed xrf spectrometers
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xrf instrument
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