X-RAY PHOTOELECTRON SPECTROMETERS
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State-of-the-art specifications in the XPS world Unrivalled automated sample handling and ease of use High resolution and high sensitivity spectroscopy New Windows-based control software - ESCApe Small spot size: < 15µm Lateral resolution: 1µm Delay-Line Detector (DLD) with 128 detector channels 180º Hemispherical analyser (HSA) for spectroscopy Spherical mirror analyser (SMA) for parallel imaging High power Al monochromator X-ray source with 500mm Roland circle Fully automatic electron-only charge neutralizer Scanned and snapshot spectroscopy modes 2D imaging Multi-technique capabilities including Scanning Auger Microscopy (SAM), Schottky Field Emission Source, Ion Scattering Spectroscopy (ISS), Secondary Ion Mass Spectrometry (SIMS) & Ultraviolet Photoelectron Spectroscopy (UPS)
Spectrometers
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Spectrometers, optical microscopes
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FTIR Spectrophotometer
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Spectrometers
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