Fischer Measurement Technologies (India) Pvt. Ltd. Hinjewadi, Pune, Maharashtra

Coating thickness measurement gauge for connectors – XULM is available in various technical specifications. These are robust entry-level X-ray fluorescence measuring instruments for non-destructive material analysis and coating thickness measurement. Compact sized these devices are extensively acclaimed for their consistent performance, outstanding accuracy and longer service life. These are widely used for the non-destructive coating thickness measurement and material analysis.Applications Measurements on small parts like screws, bolts and nuts Measurements on contacts and electronic components Determining of the composition of electroplating baths

Coating thickness measurement gauge for connectors – XULM is available in various technical specifications. These are robust entry-level X-ray fluorescence measuring instruments for non-destructive material analysis and coating thickness measurement. Compact sized these devices are extensively acclaimed for their consistent performance, outstanding accuracy and longer service life. These are widely used for the non-destructive coating thickness measurement and material analysis.Applications Measurements on small parts like screws, bolts and nuts Measurements on contacts and electronic components Determining of the composition of electroplating baths

Certification : CE Certified, ISI Certified

Application : Industrial

X-ray fluorescence for coating thickness measurement and material analysis Whether for coating thickness measurement or material analysis, Fischer is your partner of choice for precise and absolutely reliable measurement technology. With our X-ray systems, we offer highly efficient solutions to make your work as easy as possible. XRF coating thickness measurement is used for measuring metallic coating and multilayer coating thickness measurement.

Type : Xrf Spectrometers

Application : Industrial Use

Power Source : Electric

Warranty : 1year

Automation Grade : Automatic

Brand Name : FISCHER

Application : XRF coating thickness measurement and material analysis

The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.Design These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis. These have programmable XY-stage, which make these perfect for auto-mated sample measurements. These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy. These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage. These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement. These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement. These are operated using the powerful and user-friendly WinFTM software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC. Typical areas of application are Analysis of very thin coatings, e.g. gold/palladium coatings of  0.1 m Trace analysis on pc boards according to ROHS and WEEE requirements Gold analysis Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control

Weight : Approx. 140 kg (308 lb)

Applications Energy dispersivex-ray fluorescence measuring instrument (EDXRF) to measure thin coatings andcoating systems on very small flat structures Aluminum Al (13) toUranium U (92)  up to 24 elements simultaneously. Bench-top unit withhood opening upwards and housing with a slot on the side. Measuring direction: Top down X-Ray Source/Detection Standard: Micro focustube with tungsten target and beryllium window Three steps: 10 kV, 30kV, 50 kV Primaryfilter:4x changeable: Ni 10m(0.4 mils); free; Al 1000m (40 mils); Al 500m (20 mils)

Material : Steel

Certification : CE Certified, ISI Certified

Application : Film Thickness Measuring

Feature : Easy To Fit, Measure Fast Reading, Perfect Strength, Robust Construction, Rust Proof

Condition : New

Power : 10W, 15W

Driven Type : Electric

Warranty : 1 Year

Voltage : 110V, 240V

Country of Origin : India

Lead Frame Coating Thickness Measurement gauge for electroplating as well as electroless coatings X-Ray or XDV-µ Fluorescence Tester is accessible in diverse technical specifications. The range of o Lead Frame Coating is used for non-destructive analyses as well as measurements of coating thickness on very tiny components and structures with complex coating systems.Applications Measurements on very tiny flat components as well as structures like contacts, printed circuit boards, or lead frames Study of very thin coatings like gold/palladium coatings of 0.1m (0.004 mils) Measurement of functional coatings in the semiconductor and electronics industries Determination of complex multi-coating systems Automated measurements like quality control General Specification Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures. Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously. Design:Bench-top unit with hood opening upwards and housing with a slot on the side. X/Y- and Z-axis electrically driven and programmable Motor-driven changeable filters Measuring direction:Top down

Application : Mechanical Engineering

Coating thickness gauge for electroplating and electroless coatings XDV-µ or X-Ray Fluorescence Tester is available in various technical specifications. These are widely used for non-destructive analyses and measurements of coating thickness on very small components and structures, even with complex coating systems.Applications Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames Analysis of very thin coatings, e.g., gold/palladium coatings of ≤ 0.1 μm (0.004 mils) Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control

The range of Lead Frame Coating is uniquely designed with high-precision, programmable XY-stage as well as an electrically.The user-friendly bench-top instruments are acclaimed for sample stage moves into the loading position automatically in case the protective hood is opened.These are solid and strong range that ensure longer stability. With laser pointer works as a positioning help and support the rapid alignment of the sample to be measured.These are carefully operated through the dominant and user-friendly WinFTM® software designed as per German regulations Deutsche R ntgenverordnung-rov". Its whole operation as well as evaluation of measurements and the clear arrangement of measurement data is performed on a PC through software.Typical areas of application are Study of very thin coatings of 0.1 m (0.004 mils) Measurements of practical coatings in the electronics as well as semiconductor industries Determination of complex multi-coating systems and lead content in solder Automated measurements such as quality control General Specification Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously Design:Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction:Top down

Application : Film Thickness Measuring

Color : Black, Grey, Shiny-silver, Sky-blue

Feature : Easy To Fit, Measure Fast Reading, Perfect Strength, Robust Construction, Rust Proof

Condition : New

Power : 10W, 15W

Driven Type : Electric

Voltage : 110V, 240V

Country of Origin : India

The instrument of Electroplating Thickness ensures quick and exact materials analysis with user-friendly features. The array is ideal for the analysis of varied precious metal as well as gold alloys. The collection comes with geometric arrangement of hardware components. X-ray source as well as detector is situated below the measurement chamber and the measurement is conducted from bottom to top for easy & swift positioning of the samples. The range comes in varied versions only differ in terms of detectors, number of apertures, X-ray tubes, and filters.Features X-ray tube with W-anode as well as glass window or micro-focus X-ray tube having W-anode and beryllium window. Maximum operating conditions: 50 kV, 50W Proportional counter tube, Silicon drift detector as X-ray detector or silicon PIN diode Aperture: fixed or 4-x automatically exchangeable,  0.2 mm to  2 mm Primary filter: fixed, 3-x exchangeable or 6-x automatically exchangeable Fixed sample support Video camera for optical observations of the measurement position along the axis of the primary X-ray beam. Crosshairs with calibrated scale (ruler) as well as display of the measurement spot Design-approved, completely protected instrument compliant with the German X-ray ordinance. Applications Gold as well as precious metal study in the Jewellery and watch industries Measurement of thin coatings of few nanometers like Au and Pd on the printed circuit boards as well as electronics components Trace study (e.g. harmful substances in electronic components (ROHS) or tools) Examination of light elements like Al, Si, P with the XAN 250 General materials analysis as well as coating thickness measurement in testing institutions, laboratories and universities

Coating thickness gauge for electroplating and electroless coatings XDLM is engineered under the firm direction of experienced quality controllers. These are widely acknowledged as X-ray fluorescence measuring instrument for manual or automated coating thickness measurements and analyses on PC-boards. These are universally applicable energy dispersive X-ray fluorescence measuring instruments and ideal for the measurement and analysis of thin coatings, even at small concentrations. Models XDLM 231: Plane support stage, motor-driven Z-axis XDLM 232: Manually operable XY-stage, motor-driven Z-axis XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis Applications Measurement of electroplated mass-produced parts Inspection of thin coatings, e.g., decorative chromium-plating Analysis of functional coatings in the electronics and semiconductor industries Automated measurements, e.g., on printed circuit boards

Coating thickness measurement gauge XDLM237 is engineered from the best available methods as per the national and international industrial standards. The range is available for measuring manual or automated coating thickness and analysis on electronics components, PC-boards and mass-produced parts even on small parts. Our Coating Measurement Gauge is used for the measurement and study of thin coatings.Models XDLM 231: Plane support stage, motor-driven Z-axis XDLM 232: Manually operable XY-stage, motor-driven Z-axis XDLM 237: Motor-driven XY-stage that moves into the loading position mechanically, when the protective hood is opened. Motor-driven programmable Z-axis Applications Measurement of electroplated mass-produced parts Inspection of thin coatings like decorative chromium-plating Analysis of functional coatings in the electronics and semiconductor industries Automated measurements like on printed circuit boards General Specification Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and alloys. Element range:Aluminum Al (13) to Uranium U (92)  up to 24 elements simultaneously. Design:Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction:Top down

Certification : ISI Certified

Feature : Easy To Fit, Accuracy, Perfect Strength, Measure Fast Reading

Measuring Range : 0 to 2500 um

Thin Coating Thickness Measurement Instrument for electroplating and electroless coatings is designed under the direction of knowledgeable quality controllers. The range of Thin Coating Thickness is designed for automated or manual coating thickness measurements and examination on PC-boards. They are energy dispersive X-ray fluorescence measuring instruments for the measurement and investigation of thin coatings, even at small concentrations. Models XDLM 232: Manually operable XY-stage, motor-driven Z-axis XDLM 237: Motor-driven XY-stage that moves into the loading position XDLM 231: Plane support stage, motor-driven Z-axis automatically, when the protective hood is opened. Motor-driven programmable Z-axis Applications Inspection of thin coatings, e.g., decorative chromium-plating Analysis of functional coatings in the electronics and semiconductor industries Measurement of electroplated mass-produced parts Automated measurements, e.g., on printed circuit boards

Coating thickness gauge for electroplating and electroless coatings XDL is an X-ray fluorescence measuring instrument for manual or automated coating thickness measurements on protective and decorative coatings. These are extensively acknowledged as a universally applicable energy dispersive X-ray measuring instruments which are widely used for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and printed circuit boards as well as for the solution analysis. These are engineered under the firm direction of experienced quality controllers and following international industrial standard. Models XDL 210: Plane support stage, fixed Z-axis XDL 220: Plane support stage, motor-driven Z-axis XDL 230: Manually operable XY-stage, motor-driven Z-axis XDL 240: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis Applications Measurement of electroplated mass-produced parts Inspection of thin coatings, e.g., decorative chromium-plating Analysis of functional coatings in the electronics and semiconductor industries Automated measurements, e.g., on printed circuit boards Solution analysis in the electroplating

Watches Coating machine XDAL237 is engineered to use as X-ray fluorescence measuring instrument with a modern programmable XY-stage and Z-axis for automated measurements. Our Watches Coating Thickness device is ideal to test the thin coatings in Gold Hallmarking, Manufacturing and Assaying Centres. They are extensively used for non-destructive measurements and analysing very thin coatings.Design Uniquely designed with high-precision, programmable XY-stage and an electrically. User-friendly bench-top instruments for sample stage moves into the loading position automatically, when the protective hood is opened. Compact, robust and highly stable with laser pointer works as a positioning aid and help fast alignment of the sample to be measured. Operated through the powerful WinFTM® software designed as per German regulations Deutsche Rontgenverordnung-rov". Its whole process, evaluation of measurements and clear presentation of measurement data is conducted on a PC through software. Application Areas Study of very thin coatings of 0.1m (0.004 mils) Measurements of functional coatings in the electronics as well as semiconductor industries Automated measurements, e.g., in quality control Study of lead content in solder and complex multi-coating systems General Specification Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to find out thin coatings and alloys Element range:Aluminum Al (13) to Uranium U (92)  up to 24 elements simultaneously Design: Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction: Top down

Feature : Easy To Fit, Perfect Strength, Robust Construction, Rust Proof

Power : 10W, 15W

Driven Type : Electric

Voltage : 110V, 240V

Country of Origin : India

Gold testing machine in hallmarking centres: XDAL237 is engineered under the firm direction of experienced quality controllers. These are widely used as X-ray fluorescence measuring instrument with a programmable XY-stage and Z-axis for automated measurements of thin coatings in Gold Hallmarking, Assaying and Manufacturing Centres.These are widely used for non-destructive measurements and analysing very thin coatings. Design These are uniquely designed and developed with high-precision, programmable XY-stage and an electrically. These are user-friendly bench-top instruments acclaimed for sample stage moves into the loading position automatically, when the protective hood is opened. These are compact sized, robust designed and ensure longer stability. Its laser pointer works as a positioning aid and supports the quick alignment of the sample to be measured. These are operated through the powerful and user-friendly WinFTM® software and designed as per German regulations Deutsche Rontgenverordnung-rov". Its entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC through software.   Typical areas of application are Analysis of very thin coatings of 0.1 ¼m (0.004 mils) Measurements of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control Determination of the lead content in solder   General Specification Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys Element range:Aluminum Al (13) to Uranium U (92)  up to 24 elements simultaneously Design:Bench-top unit with hood opening upwards XY-stage and Z-axis  electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction: Top down   X-Ray Source X-ray tube Micro focus tungsten tube with beryllium window High voltage Three steps 10 kV, 30 kV, 50 kV Aperture (Collimator):4x changeable: 0.1 mm (3.9 mils), 0.3 mm (11.8 mils),˜ 0.6 mm (23.6 mils) slot 0.5 x 0.15 mm (19.7 x 5.9 mils), others on request Primary filter: 3x changeable (Standard configuration: Nickel, Aluminum, no filter) Measurement spot: Depending on the measuring distance and on the aperture, the actual spot size is shown in the video image. Smallest measurement approx. 0.15 mm (5.9 mils) with aperture 0.1 mm (3.9 mils)   X-Ray Detection X-ray detector Silicon PIN detector with peltier cooling Resolution (fwhm for Mn-K±) 200 eV Measurement distance:0 80 mm (0 3.2 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.   Sample Alignment Video microscope High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,manual focusing and auto-focus, crosshairs with a calibrated scale (ruler) and spot-indicator,adjustable LED illumination, laser pointer (class 1) to support accurate sample placement. Zoom factor Digital 1x, 2x, 3x, 4x   Sample Stage Design Programmable, motor-driven XY-stage Maximum Travel X/Y-axis: 255 x 235 mm (10 x 9 in); Z-axis: 140 mm (5 in) Max. travel speed 80 mm/s (3.2 in/s) Repeatability precision XY ‰0.01 mm (0.4 mils), unidirectional Usable sample placement area Width x depth [mm]: 300 x 350 mm, [in]: 12 x 14 Max. sample weight 5 kg, with reduced approach travel precision 20 kg Max. sample height 140 mm (5.5 in) Electrical Data Power supply AC 115 V or AC 230 V 50 / 60 Hz Power consumption Max. 120 W ,without evaluation PC Protection class IP40   Dimensions External dimensions Width x depth x height [mm]: 570 x 760 x 650 mm, [in]: 22 x 30 x 26 Interior dimensions Width x depth x height [mm] measurement chamber: 460 x 495 x 146 mm, [in]: 18 x 19.5 x 5.7 Weight Approx.:115 kg (52 lb)   Environmental Conditions Temperature: Operation10°C 40°C / 50°F 104 °F Temperature Storage/Transport: 0°C €“50°C / 32°F 122 °F Admissible air humidity 95 %, non-condensing   Evaluation Unit Computer Windows®-PC Software Standard:Fischer WinFTM® BASIC including PDM® Optional: Fischer WinFTM® SUPER   Standards CE approval EN 61010 X-Ray standards DIN ISO 3497 and ASTM B 568 Approval Fully protected instrument with type approval according to the German regulations "Deutsche Rontgenverordnung-RoV

Brand Name : Fischer

The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. Gold testing machine in hallmarking centres: XDV-SDD is engineered under the firm direction of expert quality controllers. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis. Design These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis. These have programmable XY-stage, which make these perfect for auto-mated sample measurements. These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy. These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage. These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement. These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement. These are operated using the powerful and user-friendly WinFTM® software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC.    Typical areas of application are: Analysis of very thin coatings, e.g. gold/palladium coatings of 0.1 ¼m Trace analysis on pc boards according to ROHS and WEEE requirements Gold analysis Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control   General Specification Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys Element range: Aluminum Al (13) to Uranium U (92) – up to 24 elements simultaneously Design: Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction: From top to bottom   X-Ray Source X-ray tube Micro focus tungsten tube with beryllium window High voltage Three steps 10 kV, 30 kV, 50 kV Aperture (Collimator): 4x changeable: 0.2 mm (7.9 mils), ˜ 0,6 mm (23.6 mils), 1 mm (39.4 mils),˜ 3 mm (118 mils), others on request Primary filter: 6x changeable (Ni, free, Al 1000 ¼m (39.4 mils), Al 500 ¼m (19.7 mils), Al 100 ¼m (3.9 mils), Mylar® 100 ¼m (3.9 mils) Measurement spot size: Depending on measurement distance and aperture, Measurement spot size‰ˆ aperture size + 10% The actual measurement spot size is shown in the video image. Smallest Measurement spot: approx. 0.25 mm (9.8 mils)   X-Ray Detection X-ray detector : Silicon Drift Detector (SDD), peltier-cooled Resolution (fwhm for Mn-K±)‰¤ 140 eV Measurement distance:0 80 mm (0 3.1 in) Distance   compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.   Sample Alignment Video microscope High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,manual focusing and auto-focus, crosshairs with a calibrated scale (ruler) and spot-indicator,adjustable LED illumination, laser pointer (class 1) to support accurate sample placement. Zoom factor Digital 1x, 2x, 3x, 4x Focusing Auto-focus and manually controlled motor focus.Manual adjustment of the focal plane in a range from 0 to 80 mm.   Sample Stage Design Fast, programmable XY-stage with pop-out function Maximum travel X/Y-axis: 250 mm x 250 mm (9.8 x 9.8 in); Z-axis: 140 mm (5.5 in) Max. travel speed 60 mm/s (0.2 ft/s) Repeatability precision XY unidirectional: 5 ¼m (0.2 mils) max., 2 ¼m (0.08 mils) typ. Usable sample placement area 370 x 320 mm (14.6 x 12.6 in) Max. sample weight5 kg (11 lb), with reduced approach travel precision 20 kg (44 lb) Max. sample height 140 mm (5.5 in)   Electrical Data Power supplyAC 115 V or AC 230 V 50 / 60 Hz Power consumptionMax. 120 W ,without evaluation PC Protection class IP40   Dimensions External dimensionsWidth x depth x height [mm]:660 x 835 x 720 mm, [in]: 26 x 32.9 x 28.3 Interior dimensions Width x depth x height [mm]: measurement chamber  580 x 560 x 145 mm, [in]: 22.8 x 22 x 5.7 Weight Approx. 140 kg (308 lb)   Environmental Conditions Temperature: Operation10°C 40°C / 50 ° 104 °F Temperature:0 °C 50°C / 32 F 122°F Storage/Transport Admissible air humidity: 95 %, non-condensing   Evaluation Unit Computer Windows®-PC Software Standard: Fischer WinFTM® BASIC including PDM®, Optional: Fischer WinFTM® SUPER   Standards CE approval EN 61010 X-Ray standards DIN ISO 3497 and ASTM B 568 Approval Fully protected instrument with type approval according to the German regulations "Deutsche Rontgenverordnung-RoV".

Weight : Approx. 140 kg (308 lb)

Gold testing machine in hallmarking centres: XAN-FD is a fast and non-destructive coating thickness measurement and material analysis. These are compact in size and widely applicable as an energy-dispersive X-ray fluorescence measuring instrument.Our machines are extensively used for non-destructive thickness measurements and material analysis. These are fitted with electrically changeable apertures and primary filters and modern silicon PIN detector for excellent detection sensitivity and high accuracy. These can be used for coating systems as well as solid and liquid Samples can be analyzed standard-free. Besides, these can easily measure up to 24 elements in a Range from aluminum (13) to uranium (92) simultaneously.Our machines are acclaimed for their long term stability, excellent accuracy, long term stability and ergonomic design. These are very easy to operate and acclaimed for fast calculation and quick data presentation. These are well suited for measuring and analyzing thin coatings, even with very complex compositions or small concentrations. Design We provide user friendly bench-top instruments. These are available in two different range including XAN-FD and XAN 152 and these differ in support stage and the housing size These are ideal to measure range of up to 22 mm. straightened with the integrated video-microscope with crosshairs and up to 184x zoom factor simplifies sample placement, these devices are very easy to install, operate and maintain These are operated through powerful WinFTM® 2 FISCHERSCOPE® X-RAY XAN®-FD, XAN® 152 -FD, XAN® XAN® 152 software, which make these very user friendly and easy to use.   Typical areas of application are Measurement of functional coatings in the electronics and semiconductor industries Analysis of alloys in the jewellery and watch industries Research in universities and in the industries   General Specifications Intended use Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys Element range Aluminum (13) to Uranium (92), up to 24 elements simultaneously Design Bench-top unit with hood opening upwards Measuring direction Bottom-up method    X-ray source X-Ray tube Micro focus tungsten tube with beryllium window High voltage Three steps 10 kV, 30 kV, 50 kV Aperture (collimator) 4x changeable: 0.2 mm, 0.6 mm, 1 mm, 2 mm, others on request Primary filter 3x changeable: Nickel, Aluminum, free, others on request Measurement spot Depending on the measuring distance and on the aperture in use; the actual measurement spot size is shown in the video image. Smallest measurement spot: approx. 0.3 mm Measuring distance 0 20 mm (0 0.8 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications an additional calibration might be necessary.   X-ray detection X-ray detector Silicon PIN detector with peltier cooling and Resolution 180 eV (fwhm at Mn-K±)Sample orientation Video microscope:High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,Crosshairs with a calibrated scale (ruler) and spot-indicator,Adjustable LED illumination of the measurement location Zoom factor:34x ... 184x (optical: 34x46x; digital: 1x, 2x, 3x, 4x)

The high-end measurement system Fischerscope X-Ray XAN 250 was developed specifically for high-precision analysis of precious metals as required for Hallmarking and assay offices. Gold testing machine in assaying centres: XAN250 is engineered using best available techniques. These are high performance X-ray fluorescence measuring instruments widely used for fast and non-destructive material analysis and coating thickness measurement. Compact sized these devices are acclaimed for high performance, longer service life and accurate measurement.Environmental Conditions Temperature Operation:10°C 40°C / 50°F 104°F Temperature Storage/Transport: 0°C 50°C / 32°F 122°F Admissible air humidity:95 %, non-condensing Evaluation Unit Computer:Windows®-PC Software:Standard: Fischer WinFTM® BASIC including PDM® Optional: Fischer WinFTM® SUPER

Gold testing machine in assaying centres: XAN220 is available in various technical specifications these are widely used for fast and non-destructive analysis and coating thickness measurement of gold and silver alloys. These are optimized X-ray fluorescence measuring instruments, acclaimed for compact size and consistent performance.These are widely used for the analysis of precious metals and their alloys in composition and coating thickness and used for the measurement of up to 24 elements in the range of chlorine (17) to uranium (92). Our products are extensively acclaimed for its excellent accuracy and long term stability.These are admired for high functional efficiency, time saving quality and effective usage. Owing to its good detection sensitivity and high accuracy, these are widely recommended by large numbers of clients. Environmental Conditions Temperature: Operation 10°C 40°C / 50°F 104°F Temperature Storage/Transport :0°C 50°C / 32 F 122°F Admissible air humidity 95 %, non-condensing Evaluation Unit Computer Windows®-PC Software Standard: Fischer WinFTM® BASIC including PDM® Optional: Fischer WinFTM® SUPER

Gold testing machine in assaying centres: XAN220 is available in various technical specifications these are widely used for fast and non-destructive analysis and coating thickness measurement of gold and silver alloys. These are optimized X-ray fluorescence measuring instruments, acclaimed for compact size and consistent performance.These are widely used for the analysis of precious metals and their alloys in composition and coating thickness and used for the measurement of up to 24 elements in the range of chlorine (17) to uranium (92). Our products are extensively acclaimed for its excellent accuracy and long term stability.These are admired for high functional efficiency, time saving quality and effective usage. Owing to its good detection sensitivity and high accuracy, these are widely recommended by large numbers of clients.

Jewellery Gold testing machine XAN220 is available in a range of technical specifications for speedy and non-destructive study and coating thickness measurement of silver and gold alloys. The array of Fashion Jewellery Testing Machine is optimized X-ray fluorescence measuring instrument with compact size and reliable performance. They are used for the study of precious metals as well as their alloys in composition and coating thickness. They are used for measuring up to 24 elements in the chlorine (17) to uranium (92) range. Our products are widely celebrated for brilliant precision and long term stability. With time saving quality, functional efficiency and effective usage, the range is widely recommended by clients.

The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. Gold testing machine in hallmarking centres: XDV-SDD is engineered under the firm direction of expert quality controllers. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.Design These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis. These have programmable XY-stage, which make these perfect for auto-mated sample measurements. These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy. These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage. These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement. These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement. These are operated using the powerful and user-friendly WinFTM® software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC. Typical areas of application are Analysis of very thin coatings, e.g. gold/palladium coatings of ≤ 0.1 μm Trace analysis on pc boards according to ROHS and WEEE requirements Gold analysis Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control  

Brand Name : Fischer

Coating thickness gauge for electroplating and electroless coatings XDV-U or X-Ray Fluorescence Tester is available in various technical specifications. These are widely used for non-destructive analyses and measurements of coating thickness on very small components and structures, even with complex coating systems.Applications Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames Analysis of very thin coatings, e.g., gold/palladium coatings of 0.1 ¼m (0.004 mils) Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control

The CMS2 STEP features the additional STEP Test (Simultaneous Thickness and Electrochemical Potential determination) function. It is used for standardised STEP Test measurements of individual coating thicknesses and differences in potential (according to ASTM B764-94 and DIN 50022) in the quality control of multiplex nickel coating systems.