Spectrometers Dealers in Hinjewadi, Pune

• Weight: Approx. 140 kg (308 lb)
• Power Consumption: Max. 120 W,without evaluation PC
• Protection class: IP40
• Temperature: 0 to 50 Deg C / 32 to 122 Deg F
• Computer: Windows-PC

The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.Design These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis. These have programmable XY-stage, which make these perfect for auto-mated sample measurements. These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy. These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage. These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement. These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement. These are operated using the powerful and user-friendly WinFTM software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC. Typical areas of application are Analysis of very thin coatings, e.g. gold/palladium coatings of  0.1 m Trace analysis on pc boards according to ROHS and WEEE requirements Gold analysis Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control