XDV-U Wafer & Lead Frame Coating Thickness Measurement System
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Lead Frame Coating Thickness Measurement gauge for electroplating as well as electroless coatings X-Ray or XDV-µ Fluorescence Tester is accessible in diverse technical specifications. The range of o Lead Frame Coating is used for non-destructive analyses as well as measurements of coating thickness on very tiny components and structures with complex coating systems.Applications Measurements on very tiny flat components as well as structures like contacts, printed circuit boards, or lead frames Study of very thin coatings like gold/palladium coatings of 0.1m (0.004 mils) Measurement of functional coatings in the semiconductor and electronics industries Determination of complex multi-coating systems Automated measurements like quality control General Specification Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures. Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously. Design:Bench-top unit with hood opening upwards and housing with a slot on the side. X/Y- and Z-axis electrically driven and programmable Motor-driven changeable filters Measuring direction:Top down