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atomic force microscope
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We are offering atomic force microscope. Tight mechanical coupling yields excellent noise performance. integrated with inverted optical microscopes. two independent, xy and closed-loop z scanner. flat and linear xy scan of up to 40 µm × 40 µm with low residual bow. accurate height measurements. less tip wear for prolonged high-quality and high-resolution imaging. minimized sample damage or modification. immunity from parameter-dependent results observed in tapping imaging. easy sample or tip exchange and easy head removal. direct on-axis optics for high resolution optical viewing. back-lash free sample-stage. Sample positioning range of 7 mm in x and y. compatible with both reflection and transmission optical viewing.
