Scanning Probe Microscope
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Scanning probe microscope (spm)is a branch of microscope that forms images of surfaces using a physical probe that scans the specimen. Spm was founded with the invention of the scanning tunneling microscope in 1981. Technical specifications: maximum z-range: 5 μm derive resolution z: 0.07 nm derive resolution xy:0.25 nm motorized sample movement imaging modes for afm: contact and semi-contact and non-contact maximum xy-range for stm: 20 μm imaging modes for stm: constant current, constant height. Special features: expandable to suit user needs unique priceperformance ratio for research and teaching mechanical stability ergonomic design easy maintenance